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HARVARD Citation
Lv, C. et al. (2020). An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process. Microelectronics and reliability. p. . [Online].
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Lv, C. et al. (2020). An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process. Microelectronics and reliability. p. . [Online].