Cite
HARVARD Citation
Modolo, N. et al. (2020). A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects. Microelectronics and reliability. p. . [Online].
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Modolo, N. et al. (2020). A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects. Microelectronics and reliability. p. . [Online].