Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length. (May 2015)
- Record Type:
- Journal Article
- Title:
- Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length. (May 2015)
- Main Title:
- Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length
- Authors:
- Thiessen, A.
Beyreuther, E.
Werner, R.
Koelle, D.
Kleiner, R.
Eng, L.M. - Abstract:
- Abstract: Cerium-doped LaMnO3 is widely discussed as one of the most prospective electron-doped thin-film prototype material that complements well-established hole-doped mixed-valence manganites. Here, we investigate La0.7 Ce0.3 MnO3 films with respect to their electrical properties and check whether they provide an effective electron doping with Mn-valences well below +3. Thin films of a variable thickness between 10 and 100 nm are characterized through resistance measurements over a broad temperature range between 90 and 300 K deducing their hopping energies, carrier localization lengths, and the Mn valence by comparing the experimental data to different transport models. While electronic transport above 300 K is well determined by the thermally activated diffusion of small polarons, we find the carrier localization by disorder to reveal a variable-range hopping-type transport for lower temperatures. From the several parameters investigated in the study, it is mainly the oxygen content and the degree of CeO2 phase segregation that are crucial to be controlled in such electron-doped thin-film manganites. Abstract : Highlights: The resistance of La0.7 Ce0.3 MnO3 films was investigated over a broad temperature range. Depending on the state of oxygen content, different hopping types were identified. Furthermore, the degree of CeO2 phase segregation is crucial for the transport. A number of the so far unknown electrical parameters were quantified for this compound.
- Is Part Of:
- Journal of physics and chemistry of solids. Volume 80(2015:May)
- Journal:
- Journal of physics and chemistry of solids
- Issue:
- Volume 80(2015:May)
- Issue Display:
- Volume 80 (2015)
- Year:
- 2015
- Volume:
- 80
- Issue Sort Value:
- 2015-0080-0000-0000
- Page Start:
- 26
- Page End:
- 33
- Publication Date:
- 2015-05
- Subjects:
- Oxides -- Thin films -- Electrical conductivity -- Transport properties
Solids -- Periodicals
Solides -- Périodiques
Solids
Periodicals
530.41 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00223697 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.jpcs.2014.12.014 ↗
- Languages:
- English
- ISSNs:
- 0022-3697
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5036.500000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14802.xml