Improved bootstrap confidence intervals for the process capability index Cpk. Issue 10 (2nd October 2020)

• Record Type: Journal Article
• Authors: Park, Chanseok; Dey, Sanku; Ouyang, Linhan; Byun, Jai-Hyun; Leeds, Mark
• Is Part Of: Communications in statistics. Volume 49:Issue 10(2020)
• Page Start: 2583
• Page End: 2603
• Publication Date: 2020-10-02
• Subjects: Bootstrap -- Confidence interval -- Process capability index -- Statistical power; 60E05 -- 62F10 -- 62F40; Mathematical statistics -- Periodicals; Mathematical statistics -- Data processing -- Periodicals; Digital computer simulation -- Periodicals; 519.5
• DOI: 10.1080/03610918.2018.1520877
• Languages: English
• ISSNs: 0361-0918

Abstract

Abstract: The process capability index, Cpk, is a useful tool for assessing the capability of a manufacturing process. There exist three well-known confidence intervals for the process capability index. These intervals are based on the standard bootstrap, the percentile bootstrap and the bias-corrected percentile bootstrap, respectively. We propose three variants of these bootstrap confidence intervals where each of the three intervals are modified in a particular way. Extensive Monte Carlo simulations are carried out and the results indicate that the three proposed bootstrap methods are generally preferred over the corresponding original schemes.