Nanoscale crystal grain characterization via linear polarization X-ray ptychography. Issue 87 (8th October 2020)

• Record Type: Journal Article
• Authors: Gao, Zirui; Holler, Mirko; Odstrcil, Michal; Menzel, Andreas; Guizar-Sicairos, Manuel; Ihli, Johannes
• Is Part Of: Chemical communications. Volume 56:Issue 87(2020)
• Page Start: 13373
• Page End: 13376
• Publication Date: 2020-10-08
• Subjects: Chemistry -- Periodicals; 540
• DOI: 10.1039/d0cc06101h
• Languages: English
• ISSNs: 1359-7345

Abstract

Abstract : Linear polarisation dependent X-ray ptychography is explored as a microstructural characterisation tool for crystal grain characterisation and orientation mapping on the nanoscale. Abstract : X-ray linear dichroism and X-ray birefringence microscopy are yet to be fully utilized as instruments in the microstructural characterization of crystalline materials. Here, we demonstrate analyser-free X-ray linear dichroism microscopy using spectroscopic hard X-ray ptychography. First experiments enabled a spectroscopic and microstructural characterisation of polycrystalline vanadium pentoxide on the nanoscale, outside of diffraction-contrast based methods.