Nanodomain analysis with cluster‐SIMS: application to the characterization of macromolecular brush architecture. (2nd September 2015)

• Record Type: Journal Article
• Authors: Yang, Fan; Cho, Sangho; Sun, Guorong; Verkhoturov, Stanislav V.; Thackeray, James W.; Trefonas, Peter; Wooley, Karen L.; Schweikert, Emile A.
• Is Part Of: Surface and interface analysis. Volume 47:Number 11(2015)
• Page Start: 1051
• Page End: 1055
• Publication Date: 2015-09-02
• Subjects: Au400 SIMS -- cluster SIMS -- event‐by‐event bombardment/detection -- diblock brush terpolymers -- self‐assembly -- nanodomain; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5812
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : We present the application of cluster‐SIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au400 4+ projectiles at 520 keV and an event‐by‐event bombardment/detection regime for the analysis of co‐localized molecular species. The performance of this SIMS method was tested on 'bottle brush' block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale. Copyright © 2015 John Wiley & Sons, Ltd.