Control of biaxial strain in single-layer molybdenite using local thermal expansion of the substrate. (16th March 2015)

• Record Type: Journal Article
• Authors: Plechinger, Gerd; Castellanos-Gomez, Andres; Buscema, Michele; van der Zant, Herre S J; Steele, Gary A; Kuc, Agnieszka; Heine, Thomas; Schüller, Christian; Korn, Tobias
• Is Part Of: 2D materials. Volume 2:Number 1(2015)
• Publication Date: 2015-03-16
• Subjects: single-layer molybdenum disulfide -- atomically thin crystal -- strain engineering -- bandstructure -- biaxial strain; Graphene -- Periodicals; Materials science -- Periodicals; Nanostructured materials -- Periodicals; 620.115
• DOI: 10.1088/2053-1583/2/1/015006
• Languages: English
• ISSNs: 2053-1583

Abstract

Abstract: Single-layer MoS2 is a direct-gap semiconductor whose electronic band structure strongly depends on the strain applied to its crystal lattice. While uniaxial strain can be easily applied in a controlled way, e.g., by bending of a flexible substrate with the atomically thin MoS2 layer on top, experimental realization of biaxial strain is more challenging. Here, we exploit the large mismatch between the thermal expansion coefficients of MoS2 and a silicone-based substrate to apply a controllable biaxial tensile strain by heating the substrate with a focused laser. The effect of this biaxial strain is directly observable in optical spectroscopy as a redshift of the MoS2 photoluminescence. We also demonstrate the potential of this method to engineer more complex strain patterns by employing highly absorptive features on the substrate to achieve non-uniform heat profiles. By comparison of the observed redshift to strain-dependent band structure calculations, we estimate the biaxial strain applied by the silicone-based substrate to be up to 0.2%, corresponding to a band gap modulation of 105 meV per percentage of biaxial tensile strain.