Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy. (20th February 2019)

Record Type:: Journal Article
Title:: Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy. (20th February 2019)
Main Title:: Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy
Authors:: Wang, W.X.
Ling, Z.X.
Zhang, C.
Jia, Z.Q.
Wang, X.Y.
Wu, Q.
Yuan, W.M.
Zhang, S.N.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 14:Number 2(2019)
Journal:: Journal of instrumentation
Issue:: Volume 14:Number 2(2019)
Issue Display:: Volume 14, Issue 2 (2019)
Year:: 2019
Volume:: 14
Issue:: 2
Issue Sort Value:: 2019-0014-0002-0000
Page Start:: P02025
Page End:: P02025
Publication Date:: 2019-02-20
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/14/02/P02025 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14715.xml