Atomically tunable photo-assisted electrochemical oxidation process design for the decoration of ultimate-thin CuO on Cu2O photocathodes and their enhanced photoelectrochemical performances. Issue 41 (15th October 2020)
- Record Type:
- Journal Article
- Title:
- Atomically tunable photo-assisted electrochemical oxidation process design for the decoration of ultimate-thin CuO on Cu2O photocathodes and their enhanced photoelectrochemical performances. Issue 41 (15th October 2020)
- Main Title:
- Atomically tunable photo-assisted electrochemical oxidation process design for the decoration of ultimate-thin CuO on Cu2O photocathodes and their enhanced photoelectrochemical performances
- Authors:
- Kim, Dong Su
Kim, Young Been
Jung, Sung Hyeon
Deshpande, Nishad G.
Choi, Ji Hoon
Lee, Ho Seong
Cho, Hyung Koun - Abstract:
- Abstract : A representative method of forming CuO thin films on Cu2 O photoabsorbers is simple annealing oxidation at high temperature in a controlled oxygen atmosphere, but the typical oxidation process is irregular, resulting in a high density of defect sites. Abstract : A representative method of forming CuO thin films on Cu2 O photoabsorbers is simple annealing oxidation at high temperature in a controlled oxygen atmosphere, but the typical oxidation process is very quick and irregular, resulting in a high density of defect sites. To maximize the beneficial effect of CuO/Cu2 O heterojunction photocathodes, novel criteria for CuO preparation have been suggested: (1) in-plane epitaxy with Cu2 O, (2) atomic layer-by-layer growth, (3) ultimate-thin and completely conformal coating, and (4) minimized internal defects. As a novel strategy to achieve these criteria, we propose a photo-assisted electrochemical oxidation (PAEO) method, where the Cu2 O surface is precisely phase-changed into the ultimate-thin CuO layer with a thickness of 4 nm via fine thickness control using photoenergy and an external potential at room temperature. The produced CuO crystals are grown on Cu2 O without generating structural defects by accommodating the epitaxial relationship below the critical thickness. From static and dynamic (photo)electrochemical analyses, the decoration of ultimate-thin CuO offers high electrical conductivity and fast charge transport, guarantees sufficient open-circuitAbstract : A representative method of forming CuO thin films on Cu2 O photoabsorbers is simple annealing oxidation at high temperature in a controlled oxygen atmosphere, but the typical oxidation process is irregular, resulting in a high density of defect sites. Abstract : A representative method of forming CuO thin films on Cu2 O photoabsorbers is simple annealing oxidation at high temperature in a controlled oxygen atmosphere, but the typical oxidation process is very quick and irregular, resulting in a high density of defect sites. To maximize the beneficial effect of CuO/Cu2 O heterojunction photocathodes, novel criteria for CuO preparation have been suggested: (1) in-plane epitaxy with Cu2 O, (2) atomic layer-by-layer growth, (3) ultimate-thin and completely conformal coating, and (4) minimized internal defects. As a novel strategy to achieve these criteria, we propose a photo-assisted electrochemical oxidation (PAEO) method, where the Cu2 O surface is precisely phase-changed into the ultimate-thin CuO layer with a thickness of 4 nm via fine thickness control using photoenergy and an external potential at room temperature. The produced CuO crystals are grown on Cu2 O without generating structural defects by accommodating the epitaxial relationship below the critical thickness. From static and dynamic (photo)electrochemical analyses, the decoration of ultimate-thin CuO offers high electrical conductivity and fast charge transport, guarantees sufficient open-circuit potential (OCP), and substantially retains the initial OCP value by minimizing the contribution of recombination loss. Finally, the PAEO-treated photocathodes exhibit an excellent photocurrent density of 15 mA cm −2 (approaching the theoretical maximum current) and 8.3 mA cm −2 at 0 V vs. RHE in electrolytes with and without scavenger hydrogen peroxide (H2 O2 ), respectively, as well as a OCP of 0.78 V, even with the use of suboptimal Al-doped ZnO buffer layers. … (more)
- Is Part Of:
- Journal of materials chemistry. Volume 8:Issue 41(2020)
- Journal:
- Journal of materials chemistry
- Issue:
- Volume 8:Issue 41(2020)
- Issue Display:
- Volume 8, Issue 41 (2020)
- Year:
- 2020
- Volume:
- 8
- Issue:
- 41
- Issue Sort Value:
- 2020-0008-0041-0000
- Page Start:
- 21744
- Page End:
- 21755
- Publication Date:
- 2020-10-15
- Subjects:
- Materials -- Research -- Periodicals
Chemistry, Analytic -- Periodicals
Environmental sciences -- Research -- Periodicals
543.0284 - Journal URLs:
- http://pubs.rsc.org/en/journals/journalissues/ta ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/d0ta06010k ↗
- Languages:
- English
- ISSNs:
- 2050-7488
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5012.205100
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 14708.xml