Optimization of FIB–SEM Tomography and Reconstruction for Soft, Porous, and Poorly Conducting Materials. (August 2020)
- Record Type:
- Journal Article
- Title:
- Optimization of FIB–SEM Tomography and Reconstruction for Soft, Porous, and Poorly Conducting Materials. (August 2020)
- Main Title:
- Optimization of FIB–SEM Tomography and Reconstruction for Soft, Porous, and Poorly Conducting Materials
- Authors:
- Fager, Cecilia
Röding, Magnus
Olsson, Anna
Lorén, Niklas
von Corswant, Christian
Särkkä, Aila
Olsson, Eva - Abstract:
- Abstract: Abstract : Tomography using a focused ion beam (FIB) combined with a scanning electron microscope (SEM) is well-established for a wide range of conducting materials. However, performing FIB–SEM tomography on ion- and electron-beam-sensitive materials as well as poorly conducting soft materials remains challenging. Some common challenges include cross-sectioning artifacts, shadowing effects, and charging. Fully dense materials provide a planar cross section, whereas pores also expose subsurface areas of the planar cross-section surface. The image intensity of the subsurface areas gives rise to overlap between the grayscale intensity levels of the solid and pore areas, which complicates image processing and segmentation for three-dimensional (3D) reconstruction. To avoid the introduction of artifacts, the goal is to examine porous and poorly conducting soft materials as close as possible to their original state. This work presents a protocol for the optimization of FIB–SEM tomography parameters for porous and poorly conducting soft materials. The protocol reduces cross-sectioning artifacts, charging, and eliminates shadowing effects. In addition, it handles the subsurface and grayscale intensity overlap problems in image segmentation. The protocol was evaluated on porous polymer films which have both poor conductivity and pores. 3D reconstructions, with automated data segmentation, from three films with different porosities were successfully obtained.
- Is Part Of:
- Microscopy and microanalysis. Volume 26:Number 4(2020)
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 26:Number 4(2020)
- Issue Display:
- Volume 26, Issue 4 (2020)
- Year:
- 2020
- Volume:
- 26
- Issue:
- 4
- Issue Sort Value:
- 2020-0026-0004-0000
- Page Start:
- 837
- Page End:
- 845
- Publication Date:
- 2020-08
- Subjects:
- 3D, -- focused ion beam, -- poorly conducting material, -- scanning electron microscopy, -- soft material, -- tomography
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927620001592 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 14687.xml