Cite
HARVARD Citation
Cho, H. et al. (2020). Critical Layer Thickness Analysis of Vertically Stacked Hyperbolic Metamaterials for Effective Negative Refraction Generation. Advanced theory and simulations. 3 (11), p. n/a. [Online].
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Cho, H. et al. (2020). Critical Layer Thickness Analysis of Vertically Stacked Hyperbolic Metamaterials for Effective Negative Refraction Generation. Advanced theory and simulations. 3 (11), p. n/a. [Online].