Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization. (October 2020)

• Record Type: Journal Article
• Authors: Paterson, Gary W.; Webster, Robert W. H.; Ross, Andrew; Paton, Kirsty A.; Macgregor, Thomas A.; McGrouther, Damien; MacLaren, Ian; Nord, Magnus
• Is Part Of: Microscopy and microanalysis. Volume 26:Number 5(2020)
• Page Start: 944
• Page End: 963
• Publication Date: 2020-10
• Subjects: 4D-STEM, -- fast pixelated detector, -- higher-order Laue zone, -- scanning precession electron diffraction, -- virtual detectors; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927620024307
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Abstract : Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of operation. However, several issues remain around the post-acquisition processing and visualization of the often very large multidimensional STEM datasets produced by them. We discuss these issues and present open source software libraries to enable efficient processing and visualization of such datasets. Throughout, we provide examples of the analysis methodologies presented, utilizing data from a 256 × 256 pixel Medipix3 hybrid DED detector, with a particular focus on the STEM characterization of the structural properties of materials. These include the techniques of virtual detector imaging; higher-order Laue zone analysis; nanobeam electron diffraction; and scanning precession electron diffraction. In the latter, we demonstrate a nanoscale lattice parameter mapping with a fractional precision ≤6 × 10 −4 (0.06%).