Cite
HARVARD Citation
Brazil, O. et al. (2020). In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression. Journal of materials research. 35 (6), pp. 644-653. [Online].
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Brazil, O. et al. (2020). In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression. Journal of materials research. 35 (6), pp. 644-653. [Online].