Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage. (August 2020)

• Record Type: Journal Article
• Authors: Nord, Magnus; Webster, Robert W. H.; Paton, Kirsty A.; McVitie, Stephen; McGrouther, Damien; MacLaren, Ian; Paterson, Gary W.
• Is Part Of: Microscopy and microanalysis. Volume 26:Number 4(2020)
• Page Start: 653
• Page End: 666
• Publication Date: 2020-08
• Subjects: 4D STEM, -- fast pixelated detector, -- file formats, -- live data processing, -- Medipix3; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927620001713
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Abstract : The use of fast pixelated detectors and direct electron detection technology is revolutionizing many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated with them. These include issues related to hardware control, and the acquisition, real-time processing and visualization, and storage of data from such detectors. We discuss these problems and present software solutions for them, with a view to making the benefits of new detectors in the context of STEM more accessible. Throughout, we provide examples of the application of the technologies presented, using data from a Medipix3 direct electron detector. Most of our software are available under an open source licence, permitting transparency of the implemented algorithms, and allowing the community to freely use and further improve upon them.