Atomic electron tomography in three and four dimensions. (April 2020)

• Record Type: Journal Article
• Authors: Zhou, Jihan; Yang, Yongsoo; Ercius, Peter; Miao, Jianwei
• Editors: Yan, Hanfei; Voorhees, Peter W.; Xin, Huolin L.
• Is Part Of: MRS bulletin. Volume 45:Number 4(2020:Apr.)
• Page Start: 290
• Page End: 297
• Publication Date: 2020-04
• Subjects: Materials -- Periodicals; 620.11
• DOI: 10.1557/mrs.2020.88
• Languages: English
• ISSNs: 0883-7694

Abstract

Abstract: Abstract : Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. Here, we review the recent experimental and algorithmic developments of AET and highlight several groundbreaking experiments, which include pinpointing the 3D atom positions and chemical order/disorder in technologically relevant materials and capturing how atoms rearrange during early nucleation at four-dimensional atomic resolution.