Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector. (October 2020)

• Record Type: Journal Article
• Authors: Chen, Xi; Hauwiller, Matthew R.; Kumar, Abinash; Penn, Aubrey N.; LeBeau, James M.
• Is Part Of: Microscopy and microanalysis. Volume 26:Number 5(2020)
• Page Start: 938
• Page End: 943
• Publication Date: 2020-10
• Subjects: diffuse scattering, -- direct electron cameras, -- electron diffraction, -- high dynamic range; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927620024277
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Abstract : We report an approach to expand the effective number of pixels available to small, two-dimensional electron detectors. To do so, we acquire subsections of a diffraction pattern that are then accurately stitched together in post-processing. Using an electron microscopy pixel array detector (EMPAD) that has only 128 × 128 pixels, we show that the field of view can be expanded while achieving high reciprocal-space sampling. Further, we highlight the need to properly account for the detector position (rotation) and the non-orthonormal diffraction shift axes to achieve an accurate reconstruction. Applying the method, we provide examples of spot and convergent beam diffraction patterns acquired with a pixelated detector.