Magnesium fluoride as low-refractive index material for near-ultraviolet filters applied to optical sensors. (November 2020)
- Record Type:
- Journal Article
- Title:
- Magnesium fluoride as low-refractive index material for near-ultraviolet filters applied to optical sensors. (November 2020)
- Main Title:
- Magnesium fluoride as low-refractive index material for near-ultraviolet filters applied to optical sensors
- Authors:
- Silva, M.F.
Pimenta, S.
Rodrigues, J.A.
Freitas, J.R.
Ghaderi, M.
Goncalves, L.M.
de Graaf, G.
Wolffenbuttel, R.F.
Correia, J.H. - Abstract:
- Abstract: This article describes the fabrication of MgF2 and MgO thin-film-based optical filters and compares the optical transmission of the filters over UV. The MgF2 thin-films were deposited by use of an e-beam technique and their optical properties were characterised by ellipsometry. The effect of substrate temperature on the optical properties was studied. The MgF2 optimum refractive indices were obtained with a substrate temperature between 200 °C and 300 °C. Optical simulations were performed to compare the performance of MgF2 and MgO in the fabrication of near-UV narrow bandpass optical filters. While MgO-based optical filters result in a higher transmittance peak intensity, especially at 350 nm, the MgF2 optical filters are narrower, present lower values of FWHM, a mean value of 20 nm. This feature could be especially relevant for specific applications on fluorescent optical sensors. Finally, a Fabry-Perot based on a MgF2 /TiO2 optical filter was deposited, using an e-beam technique for the MgF2 thin-films and RF-sputtering technique for the TiO2 thin-films. The MgF2 /TiO2 optical filter peak transmittance is approximately 70% close to 400 nm, as expected. The results are discussed with focus on applications in fluorescent optical sensors for peaks at 350, 370, 380 and 400 nm, respectively. Highlights: MgF2 /TiO2 UV optical filter fabrication. Comparison between MgO/TiO2 and MgF2 /TiO2 UV optical filters. The MgF2 /TiO2 UV optical filter was optically;Abstract: This article describes the fabrication of MgF2 and MgO thin-film-based optical filters and compares the optical transmission of the filters over UV. The MgF2 thin-films were deposited by use of an e-beam technique and their optical properties were characterised by ellipsometry. The effect of substrate temperature on the optical properties was studied. The MgF2 optimum refractive indices were obtained with a substrate temperature between 200 °C and 300 °C. Optical simulations were performed to compare the performance of MgF2 and MgO in the fabrication of near-UV narrow bandpass optical filters. While MgO-based optical filters result in a higher transmittance peak intensity, especially at 350 nm, the MgF2 optical filters are narrower, present lower values of FWHM, a mean value of 20 nm. This feature could be especially relevant for specific applications on fluorescent optical sensors. Finally, a Fabry-Perot based on a MgF2 /TiO2 optical filter was deposited, using an e-beam technique for the MgF2 thin-films and RF-sputtering technique for the TiO2 thin-films. The MgF2 /TiO2 optical filter peak transmittance is approximately 70% close to 400 nm, as expected. The results are discussed with focus on applications in fluorescent optical sensors for peaks at 350, 370, 380 and 400 nm, respectively. Highlights: MgF2 /TiO2 UV optical filter fabrication. Comparison between MgO/TiO2 and MgF2 /TiO2 UV optical filters. The MgF2 /TiO2 UV optical filter was optically; morphologically and chemically characterized. The recipe for fabrication of MgF2 is presented with most updated results in comparison with the references. … (more)
- Is Part Of:
- Vacuum. Volume 181(2020)
- Journal:
- Vacuum
- Issue:
- Volume 181(2020)
- Issue Display:
- Volume 181, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 181
- Issue:
- 2020
- Issue Sort Value:
- 2020-0181-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-11
- Subjects:
- Optical sensors -- Near-ultraviolet range -- Thin-film optical filters -- Magnesium fluoride -- Ellipsometry -- Electron beam -- RF sputtering -- Optical transmittance -- Scanning electron microscopy -- Energy-dispersive X-ray spectroscopy
Vacuum -- Periodicals
621.55 - Journal URLs:
- http://www.elsevier.com/journals ↗
http://www.sciencedirect.com/science/journal/0042207X ↗ - DOI:
- 10.1016/j.vacuum.2020.109673 ↗
- Languages:
- English
- ISSNs:
- 0042-207X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 9139.000000
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British Library STI - ELD Digital store - Ingest File:
- 14542.xml