Cite
HARVARD Citation
Sezgin-Ugranlı, H. et al. (2018). Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress. Microelectronics journal. pp. 81-87. [Online].
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Sezgin-Ugranlı, H. et al. (2018). Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress. Microelectronics journal. pp. 81-87. [Online].