Machine learning deciphers structural features of RNA duplexes measured with solution X-ray scattering. (2020)

Record Type:: Journal Article
Title:: Machine learning deciphers structural features of RNA duplexes measured with solution X-ray scattering. (2020)
Main Title:: Machine learning deciphers structural features of RNA duplexes measured with solution X-ray scattering
Authors:: Chen, Yen-Lin
Pollack, Lois
Is Part Of:: IUCrJ. Volume 7:Part 5(2020)
Journal:: IUCrJ
Issue:: Volume 7:Part 5(2020)
Issue Display:: Volume 7, Issue 5, Part 5 (2020)
Year:: 2020
Volume:: 7
Issue:: 5
Part:: 5
Issue Sort Value:: 2020-0007-0005-0005
Page Start:: 870
Page End:
Publication Date:: 2020
Subjects:: Crystallography -- Periodicals
548.05
Journal URLs:: http://journals.iucr.org/m/ ↗
DOI:: Https://doi.org/10.1107/S2052252520008830 ↗
Languages:: English
ISSNs:: 2052-2525
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 14488.xml