Investigation of growth characteristics and semimetal–semiconductor transition of polycrystalline bismuth thin films. (2020)

Record Type:: Journal Article
Title:: Investigation of growth characteristics and semimetal–semiconductor transition of polycrystalline bismuth thin films. (2020)
Main Title:: Investigation of growth characteristics and semimetal–semiconductor transition of polycrystalline bismuth thin films
Authors:: Wang, Nan
Dai, Yu-Xiang
Wang, Tian-Lin
Yang, Hua-Zhe
Qi, Yang
Is Part Of:: IUCrJ. Volume 7:Part 1(2020)
Journal:: IUCrJ
Issue:: Volume 7:Part 1(2020)
Issue Display:: Volume 7, Issue 1, Part 1 (2020)
Year:: 2020
Volume:: 7
Issue:: 1
Part:: 1
Issue Sort Value:: 2020-0007-0001-0001
Page Start:: 49
Page End:
Publication Date:: 2020
Subjects:: Crystallography -- Periodicals
548.05
Journal URLs:: http://journals.iucr.org/m/ ↗
DOI:: Https://doi.org/10.1107/S2052252519015458 ↗
Languages:: English
ISSNs:: 2052-2525
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 14492.xml