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HARVARD Citation
Berthet, F. et al. (2017). Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique. Solid-state electronics. pp. 13-19. [Online].
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Berthet, F. et al. (2017). Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique. Solid-state electronics. pp. 13-19. [Online].