Cite
HARVARD Citation
Reimer, T. et al. (2016). Temperature-stable NdFeB micromagnets with high-energy density compatible with CMOS back end of line technology. MRS advances. 1 (3), pp. 209-213. [Online].
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Reimer, T. et al. (2016). Temperature-stable NdFeB micromagnets with high-energy density compatible with CMOS back end of line technology. MRS advances. 1 (3), pp. 209-213. [Online].