Method for in situ measuring the thickness of a lithium layer. (1st October 2020)

Record Type:: Journal Article
Title:: Method for in situ measuring the thickness of a lithium layer. (1st October 2020)
Main Title:: Method for in situ measuring the thickness of a lithium layer
Authors:: Kasatov, D.
Kolesnikov, Ia.
Koshkarev, A.
Makarov, A.
Sokolova, E.
Shchudlo, I.
Taskaev, S.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 15:Number 10(2020)
Journal:: Journal of instrumentation
Issue:: Volume 15:Number 10(2020)
Issue Display:: Volume 15, Issue 10 (2020)
Year:: 2020
Volume:: 15
Issue:: 10
Issue Sort Value:: 2020-0015-0010-0000
Page Start:: P10006
Page End:: P10006
Publication Date:: 2020-10-01
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/15/10/P10006 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14963.xml