Exploiting a Single‐Crystal Environment to Minimize the Charge Noise on Qubits in Silicon. Issue 40 (23rd August 2020)
- Record Type:
- Journal Article
- Title:
- Exploiting a Single‐Crystal Environment to Minimize the Charge Noise on Qubits in Silicon. Issue 40 (23rd August 2020)
- Main Title:
- Exploiting a Single‐Crystal Environment to Minimize the Charge Noise on Qubits in Silicon
- Authors:
- Kranz, Ludwik
Gorman, Samuel Keith
Thorgrimsson, Brandur
He, Yu
Keith, Daniel
Keizer, Joris Gerhard
Simmons, Michelle Yvonne - Abstract:
- Abstract: Electron spins in silicon offer a competitive, scalable quantum‐computing platform with excellent single‐qubit properties. However, the two‐qubit gate fidelities achieved so far have fallen short of the 99% threshold required for large‐scale error‐corrected quantum computing architectures. In the past few years, there has been a growing realization that the critical obstacle in meeting this threshold in semiconductor qubits is charge noise arising from the qubit environment. In this work, a notably low level of charge noise of S 0 = 0.0088 ± 0.0004 μeV 2 Hz −1 is demonstrated using atom qubits in crystalline silicon, achieved by separating the qubits from surfaces and interface states. The charge noise is measured using both a single electron transistor and an exchange‐coupled qubit pair that collectively provide a consistent charge noise spectrum over four frequency decades, with the noise level S 0 being an order of magnitude lower than previously reported. Low‐frequency detuning noise, set by the total measurement time, is shown to be the dominant dephasing source of two‐qubit exchange oscillations. With recent advances in fast (≈μs) single‐shot readout, it is shown that by reducing the total measurement time to ≈1 s, 99.99% two‐qubit S W A P gate fidelities can be achieved in single‐crystal atom qubits in silicon. Abstract : Despite electron spins in silicon offering a competitive, scalable quantum‐computing platform, two‐qubit gate fidelities to date haveAbstract: Electron spins in silicon offer a competitive, scalable quantum‐computing platform with excellent single‐qubit properties. However, the two‐qubit gate fidelities achieved so far have fallen short of the 99% threshold required for large‐scale error‐corrected quantum computing architectures. In the past few years, there has been a growing realization that the critical obstacle in meeting this threshold in semiconductor qubits is charge noise arising from the qubit environment. In this work, a notably low level of charge noise of S 0 = 0.0088 ± 0.0004 μeV 2 Hz −1 is demonstrated using atom qubits in crystalline silicon, achieved by separating the qubits from surfaces and interface states. The charge noise is measured using both a single electron transistor and an exchange‐coupled qubit pair that collectively provide a consistent charge noise spectrum over four frequency decades, with the noise level S 0 being an order of magnitude lower than previously reported. Low‐frequency detuning noise, set by the total measurement time, is shown to be the dominant dephasing source of two‐qubit exchange oscillations. With recent advances in fast (≈μs) single‐shot readout, it is shown that by reducing the total measurement time to ≈1 s, 99.99% two‐qubit S W A P gate fidelities can be achieved in single‐crystal atom qubits in silicon. Abstract : Despite electron spins in silicon offering a competitive, scalable quantum‐computing platform, two‐qubit gate fidelities to date have fallen short of the 99% threshold required for error‐corrected processors. A notably low level of charge noise of S 0 = 0.0088 ± 0.0004 μeV 2 Hz −1 is achieved by hosting atom qubits in a crystalline silicon substrate. By separating the atom qubits from surface and interface states, it is shown how 99.99% two‐qubit gate fidelities can be achieved in silicon. … (more)
- Is Part Of:
- Advanced materials. Volume 32:Issue 40(2020)
- Journal:
- Advanced materials
- Issue:
- Volume 32:Issue 40(2020)
- Issue Display:
- Volume 32, Issue 40 (2020)
- Year:
- 2020
- Volume:
- 32
- Issue:
- 40
- Issue Sort Value:
- 2020-0032-0040-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2020-08-23
- Subjects:
- atomic electronics -- charge noise -- quantum computing -- qubits -- single‐crystal silicon
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1521-4095 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adma.202003361 ↗
- Languages:
- English
- ISSNs:
- 0935-9648
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.897800
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14408.xml