Reply to the 'Comment on "Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling"' by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k. Issue 37 (14th September 2020)

• Record Type: Journal Article
• Authors: Bergren, Adam Johan; DiLabio, Gino A.; Van Dyck, Colin; Mukundan, Vineetha; Fereiro, Jerry A.
• Is Part Of: Physical chemistry chemical physics. Volume 22:Issue 37(2020)
• Page Start: 21547
• Page End: 21549
• Publication Date: 2020-09-14
• Subjects: Chemistry, Physical and theoretical -- Periodicals; 541.3
• DOI: 10.1039/d0cp03700a
• Languages: English
• ISSNs: 1463-9076

Abstract

Abstract : By clarifying the degree of surface roughness on substrates used to grow molecular films, we show that it is helpful to refine the models used to describe these surfaces to include more structure details. Abstract : Our paper [ Phys. Chem. Chem. Phys., 2019, 21, 16762] is the subject of a comment that clarifies a flaw in analysis of STM data. We accept the comment in regard to the aspect ratio considerations, but we also further clarify the main conclusions of our paper, and provide a molecular scale schematic using the data presented in the comment to help refine the original conclusions. Taken together, this shows that models presented in the literature may benefit from including more fine structure details, as better understanding may emerge from such considerations. This was the intent of our original article, and we thank the comment authors for the chance to clarify these points.