Deformation state extraction from electron backscatter diffraction patterns via simulation-based pattern-matching. (1st January 2021)

• Record Type: Journal Article
• Authors: Kurniawan, Christian; Zhu, Chaoyi; DeGraef, Marc
• Is Part Of: Scripta materialia. Number 190(2021)
• Page Start: 147
• Page End: 152
• Publication Date: 2021-01-01
• Subjects: Plastic deformation -- Electron backscatter diffraction (EBSD) -- Simulation -- Dislocation -- Deformation state extraction -- Pattern-matching; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2020.09.004
• Languages: English
• ISSNs: 1359-6462

Abstract

Graphical abstract: Abstract: A new simulation-based pattern-matching method is developed to retrieve the deformation tensor from electron backscatter diffraction patterns. Minimizing the least-squares difference between a target pattern and simulated deformed patterns, the deformation state of the target pattern can be inferred with an average absolute error of ∼ 10 − 8 for the distortion tensor under ideal conditions. The new approach is robust against significant pattern rotation compared to the cross-correlation based method. Additionally, the pattern center can be simultaneously optimized with an average absolute distortion tensor error of ∼ 10 − 4 for noise-free patterns.