P‐120: Degradation Mechanism and Lifetime Improvement of Blue Quantum‐Dot Light‐Emitting Diodes. Issue 1 (29th May 2019)
- Record Type:
- Journal Article
- Title:
- P‐120: Degradation Mechanism and Lifetime Improvement of Blue Quantum‐Dot Light‐Emitting Diodes. Issue 1 (29th May 2019)
- Main Title:
- P‐120: Degradation Mechanism and Lifetime Improvement of Blue Quantum‐Dot Light‐Emitting Diodes
- Authors:
- Ding, Wen-Cheng
Lee, Chun-Yu
Chen, Chia-Hsun
Huang, Li-Jen
Kuo, Ya-Pei
Chen, Peng-Yu
Lu, Hsueh-Hsing
Lee, Jiun-Haw - Abstract:
- Abstract : We have demonstrated that degradation of the hole‐transporting layer material in the blue quantum‐dot light‐emitting diode (QLED) is the main reason accounts for the efficiency loss operated under constant current driving, and the operation lifetime can be elongated by 85% under pulse‐mode driving compared to DC case.
- Is Part Of:
- Digest of technical papers. Volume 50:Issue 1(2019)
- Journal:
- Digest of technical papers
- Issue:
- Volume 50:Issue 1(2019)
- Issue Display:
- Volume 50, Issue 1 (2019)
- Year:
- 2019
- Volume:
- 50
- Issue:
- 1
- Issue Sort Value:
- 2019-0050-0001-0000
- Page Start:
- 1700
- Page End:
- 1701
- Publication Date:
- 2019-05-29
- Subjects:
- QLED -- blue emission -- lifetime
Information display systems -- Congresses
621.3815422 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/1799368.html ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2168-0159 ↗
http://ojps.aip.org/dbt/dbt.jsp?KEY=SIDSYM ↗
http://sid.aip.org/digest ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/sdtp.13279 ↗
- Languages:
- English
- ISSNs:
- 0097-966X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8271.680000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 14318.xml