19‐3: Examination in Application of TOF‐SIMS with MS/MS to a Degradation Analysis of OLED. Issue 1 (29th May 2019)

• Record Type: Journal Article
• Authors: Shirakura, Daichi; Suzuki, Aki; Okamura, Shinji; Akiyama, Takeshi; Shibamori, Takahiro; Miyamoto, Takashi; Sameshima, Junichiro
• Is Part Of: Digest of technical papers. Volume 50:Issue 1(2019)
• Page Start: 256
• Page End: 258
• Publication Date: 2019-05-29
• Subjects: Degradation analysis -- TOF-SIMS -- MS/MS -- Photoluminescence; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.12904
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : TOF‐SIMS with MS/MS was applied to degradation analyses of OLEDs. Photoluminescence and GCIB‐TOF‐SIMS revealed a degraded layer and molecular weights of degradation products. MS/MS by TOF‐SIMS gave more detailed structural information of degradation products than conventional TOF‐SIMS, which demonstrated effectiveness of TOF‐SIMS with MS/MS for degradation analyses of OLEDs.