3.6: High‐Reliability OLED Display Panel using Top Gate IGZO TFTs for 55inch UHD TVs. (4th October 2019)
- Record Type:
- Journal Article
- Title:
- 3.6: High‐Reliability OLED Display Panel using Top Gate IGZO TFTs for 55inch UHD TVs. (4th October 2019)
- Main Title:
- 3.6: High‐Reliability OLED Display Panel using Top Gate IGZO TFTs for 55inch UHD TVs
- Authors:
- Huang, Yongchao
Cheng, Jun
Fang, Jingang
Ding, Luke
Zhao, Ce
Zhou, Bin
Wang, Dongfang
Yan, Liangchen - Abstract:
- Abstract : To improve electrical characteristics of top gate a‐IGZO TFT we have been optimized the oxygen in IGZO layer and decreased the excess oxygen of Gate Insulator layer. We achieved that the uniformity of threshold voltages of a‐IGZO TFTs on Gen. 8.5 glass is approximately 0.61V. Also, we achieved BTS characteristic about Δ0.1V at 2hr PBTS and Δ‐0.2V at 2hr NBTiS. In addition, we demonstrated the 55‐in 4K UHD OLED TV with high reliability Image sticking.
- Is Part Of:
- Digest of technical papers. Volume 50(2019)Supplement 1
- Journal:
- Digest of technical papers
- Issue:
- Volume 50(2019)Supplement 1
- Issue Display:
- Volume 50, Issue 1 (2019)
- Year:
- 2019
- Volume:
- 50
- Issue:
- 1
- Issue Sort Value:
- 2019-0050-0001-0000
- Page Start:
- 44
- Page End:
- 46
- Publication Date:
- 2019-10-04
- Subjects:
- Oxide Semiconductor -- Thin Film Transistor -- OLED Display -- Image Sticking
Information display systems -- Congresses
621.3815422 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/1799368.html ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2168-0159 ↗
http://ojps.aip.org/dbt/dbt.jsp?KEY=SIDSYM ↗
http://sid.aip.org/digest ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/sdtp.13377 ↗
- Languages:
- English
- ISSNs:
- 0097-966X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8271.680000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 14310.xml