44.4: Invited Paper: Study on the Degradation Mechanisms of Quantum‐Dot Light‐Emitting Diodes. (4th October 2019)

Record Type:: Journal Article
Title:: 44.4: Invited Paper: Study on the Degradation Mechanisms of Quantum‐Dot Light‐Emitting Diodes. (4th October 2019)
Main Title:: 44.4: Invited Paper: Study on the Degradation Mechanisms of Quantum‐Dot Light‐Emitting Diodes
Authors:: Chen, Song
Cao, Weiran
Liu, Taili
Tsang, Sai-Wing
Yang, Yixing
Yan, Xiaolin
Qian, Lei
Abstract:
Is Part Of:: Digest of technical papers. Volume 50(2019)Supplement 1
Journal:: Digest of technical papers
Issue:: Volume 50(2019)Supplement 1
Issue Display:: Volume 50, Issue 1 (2019)
Year:: 2019
Volume:: 50
Issue:: 1
Issue Sort Value:: 2019-0050-0001-0000
Page Start:: 491
Page End:: 491
Publication Date:: 2019-10-04
Subjects:: Information display systems -- Congresses
621.3815422
Journal URLs:: http://catalog.hathitrust.org/api/volumes/oclc/1799368.html ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2168-0159 ↗
http://ojps.aip.org/dbt/dbt.jsp?KEY=SIDSYM ↗
http://sid.aip.org/digest ↗
http://onlinelibrary.wiley.com/ ↗
DOI:: 10.1002/sdtp.13539 ↗
Languages:: English
ISSNs:: 0097-966X
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 8271.680000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 14304.xml