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HARVARD Citation
Shimamoto, K. et al. (2020). Change in the defect structure of composition controlled single-phase YbFe2O4 epitaxial thin films. Japanese journal of applied physics. p. . [Online].
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Shimamoto, K. et al. (2020). Change in the defect structure of composition controlled single-phase YbFe2O4 epitaxial thin films. Japanese journal of applied physics. p. . [Online].