A Laser and Electric Pulse Modulated Nonvolatile Photoelectric Response in Nanoscale Copper Dusted Metal‐Oxide‐Semiconductor Structures. (16th July 2018)
- Record Type:
- Journal Article
- Title:
- A Laser and Electric Pulse Modulated Nonvolatile Photoelectric Response in Nanoscale Copper Dusted Metal‐Oxide‐Semiconductor Structures. (16th July 2018)
- Main Title:
- A Laser and Electric Pulse Modulated Nonvolatile Photoelectric Response in Nanoscale Copper Dusted Metal‐Oxide‐Semiconductor Structures
- Authors:
- Gan, Zhikai
Zhou, Peiqi
Dong, Anhua
Zheng, Diyuan
Wang, Hui - Abstract:
- Abstract: A novel photoelectric response observed in a nanoscale Cu‐dusted Cu–SiO2 –Si structure is reported. By combining the application of a short voltage pulse with laser illumination, the photoelectric response of the structure can be permanently changed. Intriguingly, if a second voltage pulse of reverse polarity is applied under similar laser illumination, the photoelectric response of the structure can be restored to its initial state, showing that the photoelectric states of the structure can be switched back and forth in a nonvolatile manner. This phenomenon is attributed to a controllable change of height of the Schottky barrier formed between the Cu nanoparticles and the N‐type silicon substrate, indicating that tunneling of confined photoelectrons from the Si causes an adjustment of the Fermi level of the Cu particles. The work suggests a new switching approach for tailoring photoelectric sensors, nonvolatile memories, and even solar cells related materials. Abstract : A new type photoelectric response on silicon based discontinuous copper structure is demonstrated. By combining the application of a short voltage pulse with laser illumination, the photoelectric response can be switched back and forth in a nonvolatile manner, suggesting a new approach for tailoring photoelectric devices.
- Is Part Of:
- Advanced Electronic Materials. Volume 4:Number 11(2018)
- Journal:
- Advanced Electronic Materials
- Issue:
- Volume 4:Number 11(2018)
- Issue Display:
- Volume 4, Issue 11 (2018)
- Year:
- 2018
- Volume:
- 4
- Issue:
- 11
- Issue Sort Value:
- 2018-0004-0011-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2018-07-16
- Subjects:
- charge trapping effects -- metal‐oxide‐semiconductors -- photoelectric effects -- Schottky barriers
Materials -- Electric properties -- Periodicals
Materials science -- Periodicals
Magnetic materials -- Periodicals
Electronic apparatus and appliances -- Periodicals
537 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2199-160X ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/aelm.201800234 ↗
- Languages:
- English
- ISSNs:
- 2199-160X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.848400
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14171.xml