An Experimental Method on the EMP Resistance of QLED Device. Issue 4 (December 2018)

• Record Type: Journal Article
• Authors: Zhao, Mo; Wu, Wei; Cheng, Yinhui; Li, Jinxi; Ma, Liang; Liu, Yifei; Guo, Jinghai; Wang, Wenbing; Wang, Xutong
• Is Part Of: IOP conference series. Volume 452:Issue 4(2018)
• Publication Date: 2018-12
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/452/4/042178
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: An experimental method on the electromagnetic pulse resistance of quantum dot light-emitting diode device is researched in this paper. If there is a strong electromagnetic pulse in the environment, the electromagnetic pulse can disturb the QLED device's work or even destroy it through coupling into the cables of the device. The noises could overwhelm the interference wave if using irradiation experiment. So, the equivalent coupling energy is calculated, and the pulse voltage injection experiment method is adopt in this paper. The experiment results supply references to the engineering practice.