Radiation hardness of GaAs:Cr and Si sensors irradiated by 21 MeV electron beam. (1st June 2020)

Record Type:: Journal Article
Title:: Radiation hardness of GaAs:Cr and Si sensors irradiated by 21 MeV electron beam. (1st June 2020)
Main Title:: Radiation hardness of GaAs:Cr and Si sensors irradiated by 21 MeV electron beam
Authors:: Kruchonak, U.
El-Azm, S. Abou
Afanaciev, K.
Chelkov, G.
Demichev, M.
Gostkin, M.
Guskov, A.
Leyva, A.
Smolyanskiy, P.
Tyazhev, A.
Zamyatin, N.
Zhemchugov, A.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 15:Number 6(2020)
Journal:: Journal of instrumentation
Issue:: Volume 15:Number 6(2020)
Issue Display:: Volume 15, Issue 6 (2020)
Year:: 2020
Volume:: 15
Issue:: 6
Issue Sort Value:: 2020-0015-0006-0000
Page Start:: C06003
Page End:: C06003
Publication Date:: 2020-06-01
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/15/06/C06003 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14137.xml