Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem. (5th August 2020)

• Record Type: Journal Article
• Authors: Albert, Samuel; Archambault, Aubin; Petrosyan, Artyom; Crauste-Thibierge, Caroline; Bellon, Ludovic; Ciliberto, Sergio
• Is Part Of: Europhysics letters. Volume 131:Number 1(2020)
• Publication Date: 2020-08-05
• Subjects: 07.10.Fq -- 05.40.Ca; Physics -- Periodicals; Electronic journals; 530.05
• DOI: 10.1209/0295-5075/131/10008
• Languages: English
• ISSNs: 0295-5075

Abstract

Abstract: The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.