Charged domains in ferroelectric, polycrystalline yttrium manganite thin films resolved with scanning electron microscopy. (13th May 2020)

• Record Type: Journal Article
• Authors: Rayapati, Venkata Rao; Bürger, Danilo; Du, Nan; Kowol, Cornelia; Blaschke, Daniel; Stöcker, Hartmut; Matthes, Patrick; Patra, Rajkumar; Skorupa, Ilona; Schulz, Stefan E; Schmidt, Heidemarie
• Is Part Of: Nanotechnology. Volume 31:Number 31(2020)
• Publication Date: 2020-05-13
• Subjects: charged domains -- ferroelectric domains -- polycrystalline -- yttrium manganite thin films -- scanning electron microscopy; Nanotechnology -- Periodicals; Nanotechnology -- Periodicals; Nanotechnology; Publications périodiques; Nanotechnologies; Periodicals; 620.5
• DOI: 10.1088/1361-6528/ab8b09
• Languages: English
• ISSNs: 0957-4484

Abstract

Abstract: We have investigated ferroelectric charged domains in polycrystalline hexagonal yttrium manganite thin films (Y1 Mn1 O3, Y0.95 Mn1.05 O3, Y1 Mn0.99 Ti0.01 O3, and Y0.94 Mn1.05 Ti0.01 O3 ) by scanning electron microscopy (SEM) in secondary electron emission mode with a small acceleration voltage. Using SEM at an acceleration voltage of 1.0 kV otherwise homogenous surface charging effects are reduced, polarization charges can be observed and polarization directions (±Pz ) of the ferroelectric domains in the polycrystalline thin films can be identified. Thin films of different chemical composition have been deposited by pulsed laser deposition on Pt/SiO2 /Si structures under otherwise same growth conditions. Using SEM it has been shown that different charged domain density networks are existing in polycrystalline yttrium manganite thin films.