Visualization of low-misorientation dislocation structures from orientation data using customized All-Euler maps. (August 2019)

• Record Type: Journal Article
• Authors: Hong, Chuanshi
• Is Part Of: IOP conference series. Volume 580(2019)
• Publication Date: 2019-08
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/580/1/012033
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: A method for visualization of low-misorientation dislocation structures from orientation data obtained by electron backscatter diffraction (EBSD) in scanning electron microscopy is presented. The method is termed "customized All-Euler maps". The microstructure of high purity (99.996 wt.%) aluminum lightly rolled to a thickness reduction of 12% is presented as a case study. Dislocation structures with misorientations across dislocation boundaries approaching the orientation precision of standard EBSD (∼0.5°) are revealed using the customized All-Euler maps. Cautions and limitations in using such maps are discussed.