The quantitative analysis of several metal elements in a solution by the confocal X-ray fluorescence thin-sample approach. Issue 1 (February 2020)

• Record Type: Journal Article
• Authors: Sun, X P; Zhang, X Y; Wang, Y B; Li, Y F; Shao, S K; Peng, S Q; Li, H Q; Liu, Z G; Sun, T X
• Is Part Of: IOP conference series. Volume 770:Issue 1(2020)
• Publication Date: 2020-02
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/770/1/012076
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: By a comprehensive combination of confocal X-ray fluorescence and thin-sample approach used in conventional X-ray fluorescence devices, a new "confocal equivalent thin-sample method" based on confocal X-ray fluorescence setup is proposed. It is used to quantify the concentration of several metal elements in a solution. Compared with the conventional X-ray fluorescence, this method could quantify the sample directly via the thin-sample approach and required not complicated sample preparing process. In the study, a liquid solution containing Cr, Mn, Fe, Co, Cu, Zn, As, Br, and Sr wase used to verify the proposed method.