Measurement of third-order nonlinear susceptibility tensor in InP using extended Z-scan technique with elliptical polarization. (10th April 2018)

• Record Type: Journal Article
• Authors: Oishi, Masaki; Shinozaki, Tomohisa; Hara, Hikaru; Yamamoto, Kazunuki; Matsusue, Toshio; Bando, Hiroyuki
• Is Part Of: Japanese journal of applied physics. Volume 57:Number 5(2018)
• Publication Date: 2018-04-10
• Subjects: Physics -- Periodicals; 621.05
• DOI: 10.7567/JJAP.57.050306
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: The elliptical polarization dependence of the two-photon absorption coefficient β in InP has been measured by the extended Z-scan technique for thick materials in the wavelength range from 1640 to 1800 nm. The analytical formula of the Z-scan technique has been extended with consideration of multiple reflections. The Z-scan results have been fitted very well by the formula and β has been evaluated accurately. The three independent elements of the third-order nonlinear susceptibility tensor in InP have also been determined accurately from the elliptical polarization dependence of β.