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HARVARD Citation
Hainey, M. et al. (2019). Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy. Applied physics express. p. . [Online].
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Hainey, M. et al. (2019). Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy. Applied physics express. p. . [Online].