A luminescence-based interpolation method for series resistance imaging in thin film solar cells. (8th April 2019)

• Record Type: Journal Article
• Authors: Ren, Aobo; Lai, Huagui; Liu, Cai; Hao, Xia; Zhang, Jingquan; Wu, Lili; Sugiyama, Masakazu
• Is Part Of: Japanese journal of applied physics. Volume 58:Number 5(2019)
• Publication Date: 2019-04-08
• Subjects: Physics -- Periodicals; 621.05
• DOI: 10.7567/1347-4065/ab0722
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: This study introduces a method combining luminescence imaging and the interpolation theorem to determine the spatially resolved series resistance, exemplified in CdTe solar cells. Based on the generalized Planck's law, a key feature of this method is that the requirement of obtaining the local diode characteristics and absolute local junction voltage is avoided. The validity of this method is shown experimentally by comparison with multi-current–voltage measurement results. In addition, it is observed that the measured effective series resistance varies with respect to terminal voltage.