Calibration of polarization effect of a high-numerical-aperture objective lens with Mueller matrix polarimetry. (21st December 2018)
- Record Type:
- Journal Article
- Title:
- Calibration of polarization effect of a high-numerical-aperture objective lens with Mueller matrix polarimetry. (21st December 2018)
- Main Title:
- Calibration of polarization effect of a high-numerical-aperture objective lens with Mueller matrix polarimetry
- Authors:
- Chen, Chao
Chen, Xiuguo
Gu, Honggang
Jiang, Hao
Zhang, Chuanwei
Liu, Shiyuan - Abstract:
- Abstract: The calibration of the polarization effect of a high-numerical-aperture (high-NA) objective lens (OL) is of great significance for high-precision polarized light micro-imaging. In this work, we propose a method to calibrate the polarization effect of a high-NA OL with Mueller matrix polarimetry in a retro-reflection configuration by using a spherical mirror as the reference sample. We present the calibration details in both the conoscopic and orthoscopic illumination modes. A high-NA OL with a NA of 0.95 is exemplified to demonstrate the capability of the proposed calibration method, and the experiments performed on two standard SiO2 /Si thin film samples with thicknesses of 25 nm and 100 nm verify the calibrated results. Compared with the existing calibration methods, the proposed method is simpler and more efficient for implementation, and moreover, the calibrated Mueller matrices contain all the polarization information of the high-NA OL under test. It is therefore expected that the proposed calibration method could provide a more complete polarization characterization of the high-NA OL.
- Is Part Of:
- Measurement science & technology. Volume 30:Number 2(2019:Feb.)
- Journal:
- Measurement science & technology
- Issue:
- Volume 30:Number 2(2019:Feb.)
- Issue Display:
- Volume 30, Issue 2 (2019)
- Year:
- 2019
- Volume:
- 30
- Issue:
- 2
- Issue Sort Value:
- 2019-0030-0002-0000
- Page Start:
- Page End:
- Publication Date:
- 2018-12-21
- Subjects:
- polarized light imaging -- polarization effect -- numerical aperture -- objective lens -- Mueller matrix -- polarimetry -- Mueller matrix decomposition
Physical measurements -- Periodicals
Scientific apparatus and instruments -- Periodicals
Equipment and Supplies -- Periodicals
Science -- instrumentation -- Periodicals
Technology -- instrumentation -- Periodicals
Mesures physiques -- Périodiques
Physical measurements
Scientific apparatus and instruments
Periodicals
502.87 - Journal URLs:
- http://iopscience.iop.org/0957-0233/ ↗
http://www.iop.org/Journals/mt ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6501/aaf4d0 ↗
- Languages:
- English
- ISSNs:
- 0957-0233
- Deposit Type:
- Legaldeposit
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- Available online (eLD content is only available in our Reading Rooms) ↗
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