Cite
HARVARD Citation
Coiffard, G. et al. (n.d.). Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors. Superconductor science & technology. p. . [Online].
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Coiffard, G. et al. (n.d.). Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors. Superconductor science & technology. p. . [Online].