Microhardness study of Cd1-x ZnxTe1-ySey crystals for X-ray and gamma ray detectors. (September 2020)

• Record Type: Journal Article
• Authors: Franc, J.; Moravec, P.; Dědič, V.; Roy, U.; Elhadidy, H.; Minárik, P.; Šíma, V.
• Is Part Of: Materials today communications. Volume 24(2020)
• Publication Date: 2020-09
• Subjects: CZTS -- Microhardness -- Bandgap -- Crystal composition; Materials science -- Periodicals; 620.11
• DOI: 10.1016/j.mtcomm.2020.101014
• Languages: English
• ISSNs: 2352-4928

Abstract

Highlights: Microhardness of CZTS, CZTand CST crystals with up to 14 at.% of Zn + Se presented. Higher microhardness in CZTS compared to CZT and CST crystals with same Zn + Se content. Microhardness, bandgap, Zn and Se composition along the crystal axis are correlated. Se plays a major role in effective solution hardening of the CdZnTeSe matrix. additional strengthening effect if Zn and Se are mixed together in the CdTe lattice. Abstract: We performed a detailed Vickers microhardness study of quaternary material Cd1−x Znx Te1−y Sey (CZTS), which is currently under investigation for applications in the detection of hard X-rays and gamma rays. In this frame, the Vickers microhardness method, resistivity mapping, low-temperature (4.2 K) photoluminescence, and Se energy dispersive X-ray spectroscopy (EDX) composition analysis were employed along the crystal growth axis. The microhardness values measured at 50 g load (HV 0.05), bandgap, and crystal composition along the crystal axis have been correlated. We also performed a comparative study of a set of CdTe, CdZnTe, and CdTeSe samples. We observed a significantly higher microhardness in CZTS crystals when compared to CdZnTe crystals. While in the CdZnTe crystals the microhardness increases by approx. 2.1 HV 0.05 per 1% of Zn + Se content, in CZTS crystals this value is 4.1 HV 0.05. This result indicates a possible additional strengthening of the effect when Zn and Se are mixed in the CdTe lattice.