Cite
HARVARD Citation
Ge, Y. et al. (2020). A key stacking factor for the effective formation of pyrene excimer in crystals: degree of π–π overlap. Journal of materials chemistry. 8 (34), pp. 11830-11838. [Online].
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Ge, Y. et al. (2020). A key stacking factor for the effective formation of pyrene excimer in crystals: degree of π–π overlap. Journal of materials chemistry. 8 (34), pp. 11830-11838. [Online].