Corrigendum to "Compositional analysis by RBS, XPS and EDX of ZnO:Al, Bi and ZnO:Ga, Bi thin films deposited by d.c. magnetron sputtering" [Vacuum 161 (2019) 268–275]. (October 2020) - Ribeiro, J.M.; Correia, F.C.; Salvador, P.B.; Rebouta, L.; Alves, L.C.; Alves, E.; Barradas, N.P.; Mendes, A.; Tavares, C.J.