Cite
HARVARD Citation
Wang, Y. et al. (2020). Deep learning for fault-relevant feature extraction and fault classification with stacked supervised auto-encoder. Journal of process control. pp. 79-89. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Wang, Y. et al. (2020). Deep learning for fault-relevant feature extraction and fault classification with stacked supervised auto-encoder. Journal of process control. pp. 79-89. [Online].