Electrical resistance response of a ZnO single-crystalline substrate to trace ethanol under pulsed air jet irradiation. (September 2020)

• Record Type: Journal Article
• Authors: Suzuki, T.T.; Adachi, Y.; Ohgaki, T.; Sakaguchi, I.; Nakamura, M.; Ohashi, H.; Aimi, A.; Fujimoto, K.
• Is Part Of: Vacuum. Volume 179(2020)
• Publication Date: 2020-09
• Subjects: Pulsed free jet -- Semiconductor gas sensor -- Electrical resistance -- ZnO(0001) -- Ethanol -- Temperature programmed desorption; Vacuum -- Periodicals; 621.55
• DOI: 10.1016/j.vacuum.2020.109526
• Languages: English
• ISSNs: 0042-207X

Abstract

Abstract: The pulsed jet technique was applied to measure the electrical resistance response of a Zn-terminated ZnO(0001) substrate to trace ethanol in the air to simulate the realistic working surface of a semiconductor gas sensor in a vacuum. The resistance response to the trace ethanol under the static atmospheric pressure air was well reproduced by the periodic pulsed jet technique with the optimal irradiation conditions, in which the pressure in the vicinity of the surface transiently reached 2 kPa. The behavior of the resistance upon the pulsed jet irradiation was discussed in terms of the ionosorption of oxygen. Because the background pressure was kept low enough during the pulsed jet irradiation, the reaction products during the ethanol sensing, such as acetaldehyde, has been successfully detected at the elevated temperature above 400 K by temperature programmed desorption-mass spectrometry (TPD-MS). Highlights: The pulsed jet technique was developed to simulate the realistic working surface of a semiconductor gas sensor in a vacuum. The resistance response of a Zn-terminated ZnO(0001) substrate to the trace ethanol under the static atmospheric pressure air was well reproduced by the pulsed jet technique. The pulsed jet technique was successfully combined with temperature programmed desorption – mass spectrometry.