A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam. Issue 3 (3rd March 2020)

• Record Type: Journal Article
• Authors: Vezhlev, E.; Ioffe, A.; Mattauch, S.; Staringer, S.; Ossovyi, V.; Felder, Ch.; Hüger, E.; Vacik, J.; Tomandl, I.; Hnatowicz, V.; Chen, C.; Notten, P.H.L.; Brückel, Th.
• Is Part Of: Radiation effects and defects in solids. Volume 175:Issue 3/4(2020)
• Page Start: 342
• Page End: 355
• Publication Date: 2020-03-03
• Subjects: Neutron depth profiling -- in situ -- operando methods -- near-surface analysis -- thin-film lithium batteries; Radiation chemistry -- Periodicals; Crystals -- Defects -- Periodicals; Crystal lattices -- Periodicals; 530.416
• DOI: 10.1080/10420150.2019.1701466
• Languages: English
• ISSNs: 1042-0150

Abstract

Abstract : A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and L i N b O 3 amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.