Cite
HARVARD Citation
Oproglidis, T. et al. (2020). Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model. Solid-state electronics. p. . [Online].
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Oproglidis, T. et al. (2020). Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model. Solid-state electronics. p. . [Online].